BS EN 60749-44:2016 - Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

BS EN 60749-44:2016

Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Status : Current   Published : November 2016

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PDF

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IEC 60749-44:2016 establishes a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays. The single event effects sensitivity is measured while the device is irradiated in a neutron beam of known flux. This test method can be applied to any type of integrated circuit.


NOTE 1 - Semiconductor devices under high voltage stress can be subject to single event effects including SEB, single event burnout and SEGR single event gate rupture, for this subject which is not covered in this document, please refer to IEC 62396-4.


NOTE 2 - In addition to the high energy neutrons some devices can have a soft error rate due to low energy (<1 eV) thermal neutrons. For this subject which is not covered in this document, please refer to IEC 62396-5.




Standard NumberBS EN 60749-44:2016
TitleSemiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
StatusCurrent
Publication Date30 November 2016
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)JESD89-1A, JEITA EDR4705, IEC 62396-5, JESD89-2A, IEC 60749-38, JESD89-3A, JESD89-A, EN 60749-38, IEC 62396-4
International RelationshipsEN 60749-44:2016,IEC 60749-44:2016
Draft Superseded By14/30299002 DC
DescriptorsWater vapour, Water-vapour tests, Climate, Gas analysis, Integrated circuits, Semiconductor devices, Moisture measurement, Environmental testing, Mechanical testing, Electronic equipment and components
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques. Méthode d'essai des effets d'un événement isolé (SEE) irradié par un faisceau de neutrons pour des dispositifs à semiconducteurs
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Prüfverfahren zur Einzelereignis- Effekt-Neutronenbestrahlung von Halbleiterbauelementen
CommitteeEPL/47
ISBN978 0 580 86203 8
PublisherBSI
FormatA4
DeliveryYes
Pages26
File Size2.105 MB
Price£182.00


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