BS IEC 62860-1:2013 - Test methods for the characterization of organic transistor-based ring oscillators

BS IEC 62860-1:2013

Test methods for the characterization of organic transistor-based ring oscillators

Status : Current   Published : August 2014

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PDF

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HARDCOPY



IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator




Standard NumberBS IEC 62860-1:2013
TitleTest methods for the characterization of organic transistor-based ring oscillators
StatusCurrent
Publication Date31 August 2014
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEEE Standard 1193-1994, IEEE 100, IEEE Standard 1139-1999
International RelationshipsIEC 62860-1:2013
DescriptorsElectronic equipment and components, Optoelectronic devices, Semiconductor devices, Organic chemistry
ICS07.030
07.120
CommitteeNTI/1
ISBN978 0 580 85646 4
PublisherBSI
FormatA4
DeliveryYes
Pages26
File Size565 KB
Price£182.00


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