BS ISO 22493:2014 - Microbeam analysis. Scanning electron microscopy. Vocabulary

BS ISO 22493:2014

Microbeam analysis. Scanning electron microscopy. Vocabulary

Status : Current, Under review   Published : April 2014

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 22493:2014
TitleMicrobeam analysis. Scanning electron microscopy. Vocabulary
StatusCurrent, Under review
Publication Date30 April 2014
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 704, ISO 10241, ISO 1087-1, ISO 18115-1:2013, ISO 23833
ReplacesBS ISO 22493:2008
International RelationshipsISO 22493:2014
DescriptorsElectron optics, Terminology, Electron beams, Electron microscopes, Microscopes, Vocabulary, Optical instruments, Instrumental methods of analysis, Scanning electron microscopes
ICS01.040.37
01.040.71
37.020
71.040.50
Title in FrenchAnalyse par microfaisceaux. Microscopie électronique à balayage. Vocabulaire
CommitteeCII/9
ISBN978 0 580 84447 8
PublisherBSI
FormatA4
DeliveryYes
Pages32
File Size1.009 MB
Price£182.00


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