BS ISO 17470:2014 - Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

BS ISO 17470:2014

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Status : Confirmed, Current   Published : January 2014

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 17470:2014
TitleMicrobeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
StatusConfirmed, Current
Publication Date31 January 2014
Confirm Date06 June 2019
Normative References(Required to achieve compliance to this standard)ISO 14594:2003
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS ISO 17470:2004
International RelationshipsISO 17470:2014
DescriptorsSpectrophotometry, Instrumental methods of analysis, Microanalysis, Dispersion (waves), Wavelengths, Chemical analysis and testing, Electron beams, Electron microscopes, Spectroscopy, X-ray fluorescence spectrometry
ICS71.040.99
Title in FrenchAnalyse par microfaisceaux. Analyse par microsonde électronique (Microsonde de Castaing). Lignes directrices pour l’analyse qualitative ponctuelle par spectrométrie de rayons X à dispersion de longueur d’onde (WDX)
CommitteeCII/9
ISBN978 0 580 84121 7
PublisherBSI
FormatA4
DeliveryYes
Pages22
File Size449 KB
Price£134.00


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