BS EN 62435-2:2017 - Electronic components. Long-term storage of electronic semiconductor devices. Deterioration mechanisms

BS EN 62435-2:2017

Electronic components. Long-term storage of electronic semiconductor devices. Deterioration mechanisms

Status : Current   Published : July 2017

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PDF

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HARDCOPY



IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with

IEC 62435-1:2017

for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.






Standard NumberBS EN 62435-2:2017
TitleElectronic components. Long-term storage of electronic semiconductor devices. Deterioration mechanisms
StatusCurrent
Publication Date06 July 2017
Normative References(Required to achieve compliance to this standard)IEC 61340-5-1:2007, IEC 60721-3-3:1994 Cons Ed 2-2, IEC 60749-21:2011, IEC 62435-1:2017, IEC 60410:1973, IEC 60749-20-1:2009, IEC TR 62258-3:2010, IEC 60721-3-1:1997, BS EN IEC 62435-4:2018, IEC 62435-4:2018
Informative References(Provided for Information)EN 190 000:1995, IEC 62435-9, IEC 60068-2-17:1994, IEC TS 61945:2000, IEC 60068-2-20:2008, IPC/JEDEC J-STD-033B:2005, IEC TR 62380:2004, IEC 62435-5:2017, IEC TR 61340-5-2:2007/COR1:2009, IEC 61760-4:2015
International RelationshipsEN 62435-2:2017,IEC 62435-2:2017
Draft Superseded By13/30286163 DC
DescriptorsSemiconductor devices, Integrating circuits, Electronic equipment and components, Terminology, Letters (symbols), Symbols, Ratings, Electric terminals, Position, Identification methods, Colour codes, Measurement, Testing conditions, Reliability, Acceptance (approval), Endurance testing, Electrical measurement, Electrical testing, Electrostatics, Sensitivity, Storage, Marking, Graphic symbols, Labels
ICS31.020
Title in FrenchComposants électroniques. Stockage de longue durée des dispositifs électroniques à semiconducteurs Mécanismes de détérioration
Title in GermanElektronische Bauteile. Langzeitlagerung elektronischer Halbleiterbauelemente Schädigungsmechanismen
CommitteeEPL/47
ISBN978 0 580 83549 0
PublisherBSI
FormatA4
DeliveryYes
Pages26
File Size977 KB
Price£182.00


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