BS ISO 17867:2015 - Particle size analysis. Small-angle X-ray scattering

BS ISO 17867:2015

Particle size analysis. Small-angle X-ray scattering

Status : Superseded, Withdrawn   Published : April 2015 Replaced By : BS ISO 17867:2020

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Standard NumberBS ISO 17867:2015
TitleParticle size analysis. Small-angle X-ray scattering
StatusSuperseded, Withdrawn
Publication Date30 April 2015
Withdrawn Date09 October 2020
Normative References(Required to achieve compliance to this standard)ISO 9276-1, ISO 9276-2, ISO/TS 27687, ISO 26824
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS ISO 17867:2020
International RelationshipsISO 17867:2015
Draft Superseded By13/30285017 DC
DescriptorsParticle size distribution, Suspensions (chemical), Particulate materials, Particle size measurement, Microscopic analysis, Optical measurement, Dispersions (chemical)
ICS19.120
Title in FrenchAnalyse granulométrique. Diffusion des rayons X aux petits angles
CommitteeLBI/37
ISBN978 0 580 83350 2
PublisherBSI
FormatA4
DeliveryYes
Pages34
File Size1.45 MB
Price£218.00


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