ASTM E2809 - 13 - Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations

ASTM E2809 - 13

Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations

Status : Current   Published : February 2013

Format
PDF

Format
HARDCOPY



1.1 This guide is an outline of methods for scanning electron microscopy (SEM) intended for use by forensic paint examiners. This guide is intended to supplement information presented in Guide E1610.

1.2 The methods used by each examiner or laboratory or both depend upon sample size, sample suitability, and laboratory equipment.

1.3 The term “scanning electron microscopy” occasionally refers to the entire analytical system including energy dispersive X-ray spectrometry (EDS) or wavelength dispersive X-ray spectrometry (WDS) or both.

1.4 This guide does not cover the theoretical aspects of many of the topics presented.

1.5 This guide cannot replace knowledge, skill, or ability acquired through appropriate education, training, and experience and should be used in conjunction with sound professional judgment.

1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.7  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.




Standard NumberASTM E2809 - 13
TitleStandard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
StatusCurrent
Publication Date15 February 2013
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors Dispersive X-ray spectrometry, EDX, EDS, Embedding, Forensic paint examination, Scanning electron microscopy, SEM
ICS07.140
PublisherASTM
FormatA4
DeliveryYes
Pages9
File Size0 KB
Price£40.00


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