BS EN 60444-8:2017 - Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units

BS EN 60444-8:2017

Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units

Status : Current   Published : May 2017



IEC 60444-8:2016 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of  load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11.

Two test fixtures are described in this document:

1)   A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.

2)   A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11.

This edition includes the following significant technical changes with respect to the previous edition:

a)   modification of Clause 1;

b)   modification of 5.2;

c)   modification of 5.3;

d)   modification of 5.4;

e)   6.3 Calibration of the reflection measurement system.

Standard NumberBS EN 60444-8:2017
TitleMeasurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
Publication Date26 May 2017
Normative References(Required to achieve compliance to this standard)IEC 61837-2:2011, IEC 60444-5:1995, EN 61837-2:2011
Informative References(Provided for Information)EN 60444-1:1997, EN 60444-2, IEC 61837, EN 61837, IEC 61837-1:2012, EN 61837-3:2015, IEC 61837-3:2015, IEC 60444-9:2007, EN 60444-7 (IEC 60444-7:2004) AS, IEC 60444-7:2004, IEC 60122-1:2002, EN 60122-1:2002, IEC 60444-6:2013, EN 60444-9:2007, IEC 60444-2:1980, EN 61837-1:2012, EN 60444-6:2013, IEC 60444-1:1986
ReplacesBS EN 60444-8:2003
International RelationshipsEN 60444-8:2017,EN 60793-2-50:2008,IEC 60444-8:2016,IEC 60793-2-50:2008
Draft Superseded By13/30283831 DC
DescriptorsDielectric devices, Piezoelectric devices, Crystal resonators, Resonators
Title in FrenchMesure des paramètres des résonateurs à quartz Dispositif d'essai pour les résonateurs à quartz montés en surface
Title in GermanMessung von Schwingquarz-Parametern Prüfaufbau für oberflächenmontierbare Schwingquarze
ISBN978 0 580 83114 0
File Size1.617 MB

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