PD IEC/TS 62607-5-1:2014 - Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Carrier transport measurements

PD IEC/TS 62607-5-1:2014

Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Carrier transport measurements

Status : Current   Published : December 2014

Format
PDF

Format
HARDCOPY



IEC TS 62607-5-1:2014(E) provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results. The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility. The purpose of this Technical Specification is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices. The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.




Standard NumberPD IEC/TS 62607-5-1:2014
TitleNanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Carrier transport measurements
StatusCurrent
Publication Date31 December 2014
Normative References(Required to achieve compliance to this standard)IEC 62860, IEC 60050
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC TS 62607-5-1:2014
DescriptorsElectronic equipment and components, Properties, Thin-film devices, Nanotechnology, Nanomaterials, Measurement
ICS07.030
07.120
CommitteeNTI/1
ISBN978 0 580 82584 2
PublisherBSI
FormatA4
DeliveryYes
Pages20
File Size1.184 MB
Price£130.00


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