PD IEC/TS 62878-2-4:2015 - Device embedded substrate. Guidelines. Test element groups (TEG)

PD IEC/TS 62878-2-4:2015

Device embedded substrate. Guidelines. Test element groups (TEG)

Status : Current   Published : April 2015

Format
PDF

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HARDCOPY



IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.




Standard NumberPD IEC/TS 62878-2-4:2015
TitleDevice embedded substrate. Guidelines. Test element groups (TEG)
StatusCurrent
Publication Date30 April 2015
Normative References(Required to achieve compliance to this standard)IEC 60194, IEC 62878-1-1
Informative References(Provided for Information)IEC TS 62878-2-1, IEC TS 62878-2-3
International RelationshipsIEC/TS 62878-2-4:2015
DescriptorsElectrical testing, Vibration testing, Industrial, Technical documents, Interfaces (data processing), Impact testing, Process control, Maintenance, Accelerated testing, Electric power system disturbances, Mechanical testing, Drop tests, Safety measures, Transducers, Dynamic testing, Classification systems, Flow measurement, Installation, Accuracy, Transmitters, Control systems, Environmental testing, Thermal testing, Grades (quality), Testing conditions, Performance testing, Test equipment, Stability, Automatic control systems, Damp-heat tests
ICS31.180
31.190
Title in FrenchSubstrat avec appareil(s) intégré(s). Directives. Groupes d'éléments d'essai (TEG)
CommitteeEPL/501
ISBN978 0 580 82121 9
PublisherBSI
FormatA4
DeliveryYes
Pages40
File Size2.3 MB
Price£214.00


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