PD ISO/TS 17915:2013 - Optics and photonics. Measurement method of semiconductor lasers for sensing

PD ISO/TS 17915:2013

Optics and photonics. Measurement method of semiconductor lasers for sensing

Status : Superseded, Withdrawn   Published : July 2013 Replaced By : BS ISO 17915:2018

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Standard NumberPD ISO/TS 17915:2013
TitleOptics and photonics. Measurement method of semiconductor lasers for sensing
StatusSuperseded, Withdrawn
Publication Date31 July 2013
Withdrawn Date31 May 2018
Normative References(Required to achieve compliance to this standard)ISO 13695
Informative References(Provided for Information)IEC 62007-1, IEC 60825, IEC 60747-5-2, IEC 60747-5-1, ISO 11145, Publication 50(521)
Replaced ByBS ISO 17915:2018
International RelationshipsISO/TS 17915:2013
DescriptorsOptics, Phase, Optical measurement, Lasers, Polarization (wave physics), Phase shift, Wave properties and phenomena, Optical instruments
ICS31.260
Title in FrenchOptique et photonique. Méthode de mesure des lasers semiconducteurs pour la sensibilité
CommitteeCPW/172
ISBN978 0 580 81129 6
PublisherBSI
FormatA4
DeliveryYes
Pages36
File Size629 KB
Price£214.00


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