ASTM F1372 - 93(2012) - Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

ASTM F1372 - 93(2012)

Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

Status : Current   Published : January 2012

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PDF

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HARDCOPY



1.1 This test method covers the testing of interior surfaces of components such as tubing, fittings, and valves for surface morphology.

1.2 This test method applies to all surfaces of tubing, connectors, regulators, valves, and any metal component, regardless of size.

1.3  Limitations:

1.3.1 This methodology assumes a SEM operator skill level typically achieved over a 12-month period.

1.3.2 This test method shall be limited to the assessment of pits, stringer, tears, grooves, scratches, inclusions, stepped grain boundaries, and other surface anomalies. However, stains and particles that may be produced during specimen preparation should be excluded in the assessment of anomalies.

1.4 The values stated in SI units are to be regarded as the standard. The inch-pound units given in parentheses are for information only.

1.5  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard statements are given in Section 6.




Standard NumberASTM F1372 - 93(2012)
TitleStandard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
StatusCurrent
Publication Date07 January 2012
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
Descriptors Components, Contamination, Gas distribution, Metallic surface condition, SEM analysis, Semiconductor processing, Surface condition
ICS17.040.20
PublisherASTM
FormatA4
DeliveryYes
Pages4
File Size139.2 KB
Price£36.00


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