BS EN 62132-1:2016 - Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions

BS EN 62132-1:2016

Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions

Status : Current   Published : March 2016

Format
PDF

Format
HARDCOPY



IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:


a) frequency range of 150 kHz to 1 GHz has been deleted from the title;


b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;


c) IC performance classes in 8.3 have been modified;


d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.




Standard NumberBS EN 62132-1:2016
TitleIntegrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
StatusCurrent
Publication Date31 March 2016
Normative References(Required to achieve compliance to this standard)EN 62132-8, IEC TS 62132-9, IEC 62132-8, EN 62132-5, IEC 62132-5, EN 62132-3, IEC 62132-2, EN 62132-4, IEC 62132-4, EN 62132-2, IEC 62132-3
Informative References(Provided for Information)EN 55020, ANSI/IEEE Std 100-1984, EN 61967-1:2002, CISPR 20, IEC 61000-4-6, IEC 61000-4-3, IEC 61967-1:2002, IEC 60050, EN 61400-4-6, EN 61400-4-3
International RelationshipsEN 62132-1:2016,IEC 62132-1:2015
Draft Superseded By12/30268333 DC
DescriptorsElectromagnetic compatibility, Electronic equipment and components, Electrical wave measurement, Electromagnetic radiation, Testing conditions, Test equipment, Electrical measurement, Integrated circuits
ICS31.200
Title in FrenchCircuits intégrés. Mesure de l'immunité électromagnétique. Conditions générales et définitions
Title in GermanIntegrierte Schaltungen. Messung der elektromagnetischen Störfestigkeit. Allgemeine Bedingungen und Begriffe
CommitteeEPL/47
ISBN978 0 580 80031 3
PublisherBSI
FormatA4
DeliveryYes
Pages30
File Size820 KB
Price£182.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


BSOL

The faster, easier way to work with standards


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


Develop a PAS

Develop a fast-track standardization document in 9-12 months