13/30264600 DC - BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid

13/30264600 DC

BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid

Status : Current, Draft for public comment   Published : June 2013

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Standard Number13/30264600 DC
TitleBS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid
StatusCurrent, Draft for public comment
Publication Date19 June 2013
Normative References(Required to achieve compliance to this standard)IEC 60747-14-1:2000, IEC 60749-36:2003, ISO/IEC GUIDE 2:2004, IEC 60721-2-1:1982, IEC 60749-1:2002
Informative References(Provided for Information)IEC 60721-3-0:1984/AMD:1987, IEC 60068-2-81:2003, IEC 60747-1:1983, IEC 60068-2-1:1990, IEC 60721-3-1:1997
International RelationshipsIEC Document 47E/458/CD
Draft Expiry Date15 July 2013
DescriptorsClimate, Gas analysis, Electronic equipment and components, Integrated circuits, Water-vapour tests, Environmental testing, Probes, Mechanical testing, Moisture measurement, Degradation, Semiconductor devices, Water vapour
ICS31.080.01
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size124 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00


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