BS ISO 17862:2013 - Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

BS ISO 17862:2013

Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

Status : Current, Under review   Published : December 2013

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 17862:2013
TitleSurface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
StatusCurrent, Under review
Publication Date31 December 2013
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 18116, ISO 13084, ISO 23830
International RelationshipsISO 17862:2013
Draft Superseded By13/30261587 DC
DescriptorsChemical analysis and testing, Secondary, Calibration, Ions, Surfaces, Control samples, Mass spectrometers, Surface chemistry, Mass spectrometry
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Spectrométrie de masse des ions secondaires. Linéarité de l’échelle d’intensité des analyseurs de masse à temps de vol pour comptage des ions individuels
CommitteeCII/60
ISBN978 0 580 78684 6
PublisherBSI
FormatA4
DeliveryYes
Pages36
File Size1.56 MB
Price£214.00


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