BS EN 60749-27:2006+A1:2012 - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

BS EN 60749-27:2006+A1:2012

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

Status : Current   Published : September 2006

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PDF

Format
HARDCOPY






Standard NumberBS EN 60749-27:2006+A1:2012
TitleSemiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
StatusCurrent
Publication Date29 September 2006
Normative References(Required to achieve compliance to this standard)IEC 61340-3-2, EN 60749-26:2006, EN 61340-3-2:2002, IEC 60749-26, IEC 60749-26:2018
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-27 Amd 1 (11/12) IEC,IEC 60749-27:2006/AMD1:2012
Amended ByAmendment, January 2013
Draft Superseded By11/30252690 DC
DescriptorsEnvironmental testing, Climate, Degradation, Integrated circuits, Electrostatics, Mechanical testing, Test models, Electronic equipment and components, Classification systems, Semiconductor devices, Damage, Sensitivity, Grades (quality), Electrical testing
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Essai de sensibilite aux decharges electrostatiques (DES). Modele de machine (MM)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Pruefung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Machine Model (MM)
CommitteeEPL/47
ISBN978 0 580 76608 4
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size643 KB
Price£130.00


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