PD IEC/TR 62878-2-2:2015 - Device embedded substrate. Guidelines. Electrical testing

PD IEC/TR 62878-2-2:2015

Device embedded substrate. Guidelines. Electrical testing

Status : Current   Published : December 2015

Format
PDF

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HARDCOPY



IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.




Standard NumberPD IEC/TR 62878-2-2:2015
TitleDevice embedded substrate. Guidelines. Electrical testing
StatusCurrent
Publication Date31 December 2015
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEC 62878-1
International RelationshipsIEC TR 62878-2-2:2015
Draft Superseded By11/30252443 DC
DescriptorsClassification systems, Integrated circuits, Printed wiring, Electrical testing, Electrical insulating materials, Electric connectors, Printed circuits, Printed-circuit boards, Printed-circuit bases, Substrates (insulating), Electronic equipment and components
ICS31.180
31.190
Title in FrenchSubstrat avec appareil(s) intégré(s). Directives. Essai électrique
CommitteeEPL/501
ISBN978 0 580 76556 8
PublisherBSI
FormatA4
DeliveryYes
Pages20
File Size851 KB
Price£130.00


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