BS EN 60749-26:2014 - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS EN 60749-26:2014

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Status : Superseded, Withdrawn   Published : June 2014 Replaced By : BS EN IEC 60749-26:2018

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IEC 60749-26:2013 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose (objective) of this standard is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. The HBM and MM test methods produce similar but not identical results; unless otherwise specified, this test method is the one selected. This edition includes the following significant technical changes with respect to the previous edition:


a) descriptions of oscilloscope and current transducers have been refined and updated;


b) the HBM circuit schematic and description have been improved;


c) the description of stress test equipment qualification and verification has been completely re-written;


d) qualification and verification of test fixture boards has been revised;


e) a new section on the determination of ringing in the current waveform has been added;


f) some alternate pin combinations have been included;


g) allowance for non-supply pins to stress to a limited number of supply pin groups (associated non-supply pins) and allowance for non-supply to non-supply (i.e., I/O to I/O) stress to be limited to a finite number of 2 pin pairs (coupled non-supply pin pairs);


h) explicit allowance for HBM stress using 2 pin HBM testers for die only shorted supply groups.




Standard NumberBS EN 60749-26:2014
TitleSemiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
StatusSuperseded, Withdrawn
Publication Date30 June 2014
Withdrawn Date24 April 2018
Normative References(Required to achieve compliance to this standard)EN 60749-27, IEC 60749-27
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN IEC 60749-26:2018
ReplacesBS EN 60749-26:2006
International RelationshipsIEC 60749-26:2013,EN 60749-26:2014
Draft Superseded By11/30250232 DC
DescriptorsSemiconductor devices, Classification systems, Damage, Mechanical testing, Sensitivity, Environmental testing, Electronic equipment and components, Electrical testing, Electrostatics, Test models, Grades (quality), Climate, Human body, Integrated circuits, Degradation
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques. Essai de sensibilité aux décharges électrostatiques (DES). Modèle du corps humain (HBM)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Human Body Model (HBM)
CommitteeEPL/47
ISBN978 0 580 76099 0
PublisherBSI
FormatA4
DeliveryYes
Pages44
File Size1.78 MB
Price£214.00


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