BS IEC 60747-10:1991 - Semiconductor devices. Generic specification for discrete devices and integrated circuits

BS IEC 60747-10:1991

Semiconductor devices. Generic specification for discrete devices and integrated circuits

Status : Current   Published : September 1991

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PDF

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HARDCOPY



General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.




Standard NumberBS IEC 60747-10:1991
TitleSemiconductor devices. Generic specification for discrete devices and integrated circuits
StatusCurrent
Publication Date30 September 1991
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS 9450:1998, BS 9970-0:1985, IEC 60747-10:1984 QC 700000:19
International RelationshipsIEC 60747-10:1991,QC 700000:1991
Amended ByAMD 9348
Corrigendum, July 2011.
Draft Superseded By86/24762 DC
DescriptorsSemiconductor devices, Integrated circuits, Electronic equipment and components, Quality assurance systems, Assessed quality, Qualification approval, Approval testing, Inspection, Specification (approval), Marking, Endurance testing, Sampling methods, Accelerated testing, Testing conditions, Capability approval, Documents, Sampling tables, Dimensions, Orientation
ICS31.080.01
31.200
Title in FrenchDispositifs à semiconducteurs. Spécification générique pour les dispositifs dicrets et les circuits intégrés
Title in GermanHalbleiterbauelemente. Einzel-Halbleiterbauelemente. Fachgrundspezifikation für Einzel-Halbleiterbauelemente und integrierte Schaltungen
CommitteeEPL/47
ISBN978 0 580 74820 2
PublisherBSI
FormatA4
DeliveryYes
Pages38
File Size783.8 KB
Price£214.00


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