BS EN 62215-3:2013 - Integrated circuits. Measurement of impulse immunity. Non-synchronous transient injection method

BS EN 62215-3:2013

Integrated circuits. Measurement of impulse immunity. Non-synchronous transient injection method

Status : Current   Published : October 2013

Format
PDF

Format
HARDCOPY



IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.




Standard NumberBS EN 62215-3:2013
TitleIntegrated circuits. Measurement of impulse immunity. Non-synchronous transient injection method
StatusCurrent
Publication Date31 October 2013
Normative References(Required to achieve compliance to this standard)EN 62132-4:2006, ISO 7637-2:2011, IEC 60050, IEC 61000-4-5:2005, IEC 61000-4-5:2005/CORR:2006, EN 61000-4-5:2006, IEC 61000-4-4:2012, EN 61000-4-4:2012, IEC 62132-4:2006
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsEN 62215-3:2013,IEC 62215-3:2013
Draft Superseded By10/30209944 DC
DescriptorsElectronic equipment and components, Integrated circuits, Impulse-voltage tests, Electromagnetic compatibility, Impulse voltages, Transient voltages, Electrical measurement, Test equipment, Semiconductors
ICS31.200
Title in FrenchCircuits intégrés. Mesure de l'immunité aux impulsions. Méthode d'injection de transitoires non synchrones
Title in GermanIntegrierte Schaltungen. Messung der Störfestigkeit gegen Impulse. Asynchrones Transienteneinspeisungs-Verfahren
CommitteeEPL/47
ISBN978 0 580 69165 2
PublisherBSI
FormatA4
DeliveryYes
Pages36
File Size635 KB
Price£214.00


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