Standard Number | BS EN 60749-29:2011 |
Title | Semiconductor devices. Mechanical and climatic test methods. Latch-up test |
Status | Current |
Publication Date | 31 August 2011 |
Normative References(Required to achieve compliance to this standard) | No other standards are normatively referenced |
Informative References(Provided for Information) | No other standards are informatively referenced |
International Relationships | EN 60749-29:2011,IEC 60749-29:2011 |
Draft Superseded By | 09/30209746 DC |
Descriptors | Climate, Electrical testing, Overvoltage, Destructive testing, Failure rate, Environmental testing, Overvoltage tests, Mechanical testing, Electronic equipment and components, Integrated circuits, Semiconductor devices, Electrical faults, Electrical impedance |
ICS | 31.080.01
|
Title in French | Dispositifs à semiconducteurs. Méthodes d'essai mécaniques et climatiques. Essai de verrouillage |
Title in German | Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Latch-up-Prüfung |
Committee | EPL/47 |
ISBN | 978 0 580 69138 6 |
Publisher | BSI |
Format | A4 |
Delivery | Yes |
Pages | 26 |
File Size | 720 KB |
Price | £186.00 |