BS EN 60749-29:2011 - Semiconductor devices. Mechanical and climatic test methods. Latch-up test

BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods. Latch-up test

Status : Current   Published : August 2011



IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:

- a number of minor technical changes;

- the addition of two new annexes covering the testing of special pins and temperature calculations.

Standard NumberBS EN 60749-29:2011
TitleSemiconductor devices. Mechanical and climatic test methods. Latch-up test
Publication Date31 August 2011
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsEN 60749-29:2011,IEC 60749-29:2011
Draft Superseded By09/30209746 DC
DescriptorsClimate, Electrical testing, Overvoltage, Destructive testing, Failure rate, Environmental testing, Overvoltage tests, Mechanical testing, Electronic equipment and components, Integrated circuits, Semiconductor devices, Electrical faults, Electrical impedance
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essai mécaniques et climatiques. Essai de verrouillage
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Latch-up-Prüfung
ISBN978 0 580 69138 6
File Size720 KB

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