BS EN 60749-32:2003+A1:2010 - Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)

BS EN 60749-32:2003+A1:2010

Semiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)

Status : Current   Published : July 2003

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PDF

Format
HARDCOPY






Standard NumberBS EN 60749-32:2003+A1:2010
TitleSemiconductor devices. Mechanical and climatic test methods. Flammability of plastic-encapsulated devices (externally induced)
StatusCurrent
Publication Date07 July 2003
Normative References(Required to achieve compliance to this standard)EN 60695-11-5:2005, IEC 60695-11-5:2004
Informative References(Provided for Information)No other standards are informatively referenced
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-32:2003/A1:2010,IEC 60749-32:2002/AMD1:2010
Amended ByAmendment, March 2011
Draft Superseded By09/30208094 DC
DescriptorsClimate, Semiconductor devices, Plastics, Flammability, Environmental testing, Electronic equipment and components, Mechanical testing, Encapsulated, Integrated circuits, Fire tests
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques. Inflammabilité des dispositifs à encapsulation plastique (cas d'une cause extérieure d'inflammation)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Entflammbarkeit von Bauelementen in Kunststoffgehäusen (Selbstentzündung)
CommitteeEPL/47
ISBN978 0 580 68754 9
PublisherBSI
FormatA4
DeliveryYes
Pages8
File Size510 KB
Price£110.00


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