BS EN 60749-23:2004+A1:2011 - Semiconductor devices. Mechanical and climatic test methods. High temperature operating life

BS EN 60749-23:2004+A1:2011

Semiconductor devices. Mechanical and climatic test methods. High temperature operating life

Status : Current, Under review   Published : June 2004

Format
PDF

Format
HARDCOPY






Standard NumberBS EN 60749-23:2004+A1:2011
TitleSemiconductor devices. Mechanical and climatic test methods. High temperature operating life
StatusCurrent, Under review
Publication Date24 June 2004
Normative References(Required to achieve compliance to this standard)EN 60749-34:2004, EN 60747, IEC 60749-34, IEC 60747
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsEN 60749-23:2004/A1:2011,IEC 60749-23:2004/AMD1:2011,IEC 61051-1:2018
Amended ByAmendment, June 2011
Draft Superseded By09/30208089 DC
DescriptorsOperating conditions, Accelerated testing, Electronic equipment and components, Environmental testing, Semiconductor devices, Endurance testing, Qualification approval, Mechanical testing, Climate, Life (durability), Performance testing, Reliability, High-temperature testing, Thermal testing, Integrated circuits
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques. Durée de vie en fonctionnemement à haute température
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Lebensdauer bei hoher Temperatur
CommitteeEPL/47
ISBN978 0 580 68753 2
PublisherBSI
FormatA4
DeliveryYes
Pages12
File Size612 KB
Price£110.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


BSOL

The faster, easier way to work with standards


Develop a PAS

Develop a fast-track standardization document in 9-12 months