BS EN 60749-7:2011 - Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases

BS EN 60749-7:2011

Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases

Status : Current   Published : September 2011

Format
PDF

Format
HARDCOPY



IEC 60749-7:2011 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive. This second edition cancels and replaces the first edition published in 2002 and constitutes a technical revision. This second edition has been completely re-written so as to align it with the text of the latest versions of MIL-STD-750, method 1018 and MIL-STD-883, method 1018. The main change is the removal of the two alternative methods formerly designated method 2 and method 3.




Standard NumberBS EN 60749-7:2011
TitleSemiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases
StatusCurrent
Publication Date30 September 2011
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEC 60749-8
ReplacesBS EN 60749-7:2002
International RelationshipsEN 60749-7:2011,IEC 60749-7:2011
Draft Superseded By09/30208079 DC
DescriptorsWater vapour, Mechanical testing, Climate, Moisture measurement, Integrated circuits, Semiconductor devices, Environmental testing, Water-vapour tests, Electronic equipment and components, Gas analysis
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques. Mesure de la teneur en humidité interne et analyse des autres gaz résiduels
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Messung des inneren Feuchtegehaltes und Analyse von anderen Restgasen
CommitteeEPL/47
ISBN978 0 580 68752 5
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size389 KB
Price£130.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Worldwide Standards
We can source any standard from anywhere in the world


BSOL

The faster, easier way to work with standards


Collaborate, Innovate, Accelerate.