BS EN 60749-30:2005+A1:2011 - Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

BS EN 60749-30:2005+A1:2011

Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing

Status : Current, Work in hand   Published : January 2006

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Standard NumberBS EN 60749-30:2005+A1:2011
TitleSemiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing
StatusCurrent, Work in hand
Publication Date27 January 2006
Normative References(Required to achieve compliance to this standard)IEC 60749-25:2003, IEC 60749-24, EN 60749-33:2004, EN 60749-5:2003, EN 60749-25:2003, EN 60749-20:2009, IEC 60749-20:2008, IEC 60749-11, IEC 60749-33, EN 60749-4:2002, EN 60749-24:2004, EN 60749-11:2002, IEC 60749-4:2017, IEC 60749-5:2017
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 60749-30:2005/AMD1:2011,IEC 60749-30:2005,EN 60749-30:2005/A1:2011
Amended ByAmendment, September 2011
Draft Superseded By09/30208070 DC
DescriptorsIntegrated circuits, Surface mounting devices, Climate, Reliability, Environmental testing, Specimen preparation, Performance testing, Mechanical testing, Electronic equipment and components, Semiconductor devices
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Méthodes d'essais mécaniques et climatiques. Préconditionnement des composants pour montage en surface non hermétiques avant les essais de fiabilité
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen
CommitteeEPL/47
ISBN978 0 580 68749 5
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size1.121 MB
Price£130.00


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