BS EN 62276:2013 - Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

BS EN 62276:2013

Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

Status : Revised, Superseded, Withdrawn   Published : February 2013 Replaced By : BS EN 62276:2016

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IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:


- terms and definitions are rearranged in accordance with the alphabetical order;


- "reduced LN" is appended to terms and definitions;


- "reduced LT" is appended to terms and definitions;


- reduction process is appended to terms and definitions.




Standard NumberBS EN 62276:2013
TitleSingle crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
StatusRevised, Superseded, Withdrawn
Publication Date28 February 2013
Withdrawn Date31 December 2016
Normative References(Required to achieve compliance to this standard)IEC 60758:2008, EN 60758:2009, IEC 60410:1973
Informative References(Provided for Information)IEC 61019-3, IEC 61019-2, IEC 60862-1, IEC 61019-1, ASTM F533, IEC 60862-3, ANSI/IEEE Std 176:1987, IEC 60862-2, ISO 4287:1997
Replaced ByBS EN 62276:2016
ReplacesBS EN 62276:2005
International RelationshipsEN 62276:2013,IEC 62276:2012
Draft Superseded By09/30207175 DC
DescriptorsQuartz, Electrical wave measurement, Piezoelectric devices, Electromechanical filters, Crystals (electronic), Acoustic filters, Substrates (insulating), Acoustoelectric devices, Acoustic measurement, Dielectric devices, Acoustic waves, Crystal resonators
ICS31.140
Title in FrenchTranches monocristallines pour applications utilisant des dispositifs à ondes acoustiques de surface (OAS). Spécifications et méthodes de mesure
Title in GermanEinkristall-Wafer für Oberflächenwellen-(OFW-)Bauelemente. Festlegungen und Messverfahren
CommitteeEPL/49
ISBN978 0 580 68581 1
PublisherBSI
FormatA4
DeliveryNo
Pages44
File Size1.592 MB
Price£214.00


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