BS ISO 13424:2013 - Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis

BS ISO 13424:2013

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis

Status : Current, Under review   Published : October 2013

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 13424:2013
TitleSurface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
StatusCurrent, Under review
Publication Date31 October 2013
Normative References(Required to achieve compliance to this standard)ISO 18115-1:2010
Informative References(Provided for Information)ISO 21270, ISO 14606, ISO/TR 18392, ISO 24237, ISO 15472, ISO 19318, ISO 18117, ISO 16243, ISO 20903, ISO 18116, ISO 18118, ISO/TR 15969
International RelationshipsISO 13424:2013
DescriptorsSpectroscopy, Photoelectron spectroscopy, X-ray analysis, Chemical analysis and testing, X-ray photoelectron spectroscopy
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Spectroscopie de photoélectrons X. Rapport des résultats de l’analyse de films minces
CommitteeCII/60
ISBN978 0 580 68394 7
PublisherBSI
FormatA4
DeliveryYes
Pages58
File Size2.547 MB
Price£254.00


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