BS IEC 60747-1:2006+A1:2010 - Semiconductor devices. General

BS IEC 60747-1:2006+A1:2010

Semiconductor devices. General

Status : Current   Published : June 2006

Format
PDF

Format
HARDCOPY






Standard NumberBS IEC 60747-1:2006+A1:2010
TitleSemiconductor devices. General
StatusCurrent
Publication Date30 June 2006
Normative References(Required to achieve compliance to this standard)IEC 60027, IEC 60050-521, IEC 61340, ISO 9000, IEC 60747, IEC 60749-26, QC 001002, IEC 60050-702, IEC 60191-2, IEC 60748, IEC 60068
Informative References(Provided for Information)IEC 60469-1, IEC 60617-DB, IEC 60050-131, IEC 60134, IEC 60747-1:1983, IEC 60319
ReplacesBS 6493-1.1:1984, IEC 60747-1:1983
International RelationshipsIEC 60747-1:2006/AMD1:2010
Amended ByAMD 16573
Amendment, July 2010; Corrigendum, June 2009
Draft Superseded By09/30205407 DC
DescriptorsLetters (symbols), Measurement, Acceptance (approval), Reliability, Electrical testing, Semiconductor devices, Electric terminals, Testing conditions, Symbols, Graphic symbols, Marking, Sensitivity, Ratings, Electrostatics, Integrated circuits, Position, Identification methods, Storage, Labels, Electronic equipment and components, Electrical measurement, Terminology, Endurance testing, Colour codes
ICS31.080.01
Title in FrenchDispositifs à semiconducteurs. Généralités
Title in GermanHalbleiterbauelemente. Einzel-Halbleiterbauelemente und integrierte Schaltungen. Allgemeines
CommitteeEPL/47
ISBN978 0 580 68217 9
PublisherBSI
FormatA4
DeliveryYes
Pages46
File Size1.088 MB
Price£240.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


Develop a PAS

Develop a fast-track standardization document in 9-12 months


Worldwide Standards
We can source any standard from anywhere in the world


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version