BS ISO 13095:2014 - Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

BS ISO 13095:2014

Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Status : Current, Under review   Published : August 2014

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 13095:2014
TitleSurface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
StatusCurrent, Under review
Publication Date31 August 2014
Normative References(Required to achieve compliance to this standard)ISO 18115-2:2010, ISO/TS 80004-4:2011
Informative References(Provided for Information)ISO 11039 ISO 11952 ISO 18115-2:2010
International RelationshipsISO 13095:2014
Draft Superseded By13/30203230 DC
DescriptorsSurfaces, Chemical analysis and testing, Spectroscopy, Surface properties, Vocabulary, Definitions
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Microscopie à balayage de sonde. Procédure pour la caractérisation in situ des sondes AFM utilisées pour mesurer la nanostructure
CommitteeCII/60
ISBN978 0 580 67752 6
PublisherBSI
FormatA4
DeliveryYes
Pages36
File Size3.41 MB
Price£214.00


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