BS ISO 15632:2012 - Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

BS ISO 15632:2012

Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Status : Current, Under review   Published : August 2012

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 15632:2012
TitleMicrobeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
StatusCurrent, Under review
Publication Date31 August 2012
Normative References(Required to achieve compliance to this standard)ISO 23833
Informative References(Provided for Information)ISO 18115-1, ANSI/IEEE 759, ASTM E1508, ISO 22309, IEC 60759, ISO/IEC 17025
ReplacesBS ISO 15632:2002
International RelationshipsISO 15632:2012
Draft Superseded By11/30199190 DC
DescriptorsSemiconductor diodes, Detectors, Semiconductors, X-ray fluorescence spectrometry, Spectroscopy, Electron beams, Chemical analysis and testing
ICS19.100
71.040.99
Title in FrenchAnalyse par microfaisceaux. Paramètres de performance instrumentale sélectionnés pour la spécification et le contrôle des spectromètres X à sélection d’énergie utilisés en microanalyse par sonde à électrons
CommitteeCII/9
ISBN978 0 580 66881 4
PublisherBSI
FormatA4
DeliveryYes
Pages22
File Size1.057 MB
Price£130.00


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