BS ISO 15632:2012 - Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

BS ISO 15632:2012

Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Status : Superseded, Withdrawn   Published : August 2012 Replaced By : BS ISO 15632:2021

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Standard NumberBS ISO 15632:2012
TitleMicrobeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
StatusSuperseded, Withdrawn
Publication Date31 August 2012
Withdrawn Date22 February 2021
Normative References(Required to achieve compliance to this standard)ISO 23833
Informative References(Provided for Information)ISO 18115-1, ANSI/IEEE 759, ASTM E1508, ISO 22309, IEC 60759, ISO/IEC 17025
Replaced ByBS ISO 15632:2021
ReplacesBS ISO 15632:2002
International RelationshipsISO 15632:2012
Draft Superseded By11/30199190 DC
DescriptorsSemiconductor diodes, Detectors, Semiconductors, X-ray fluorescence spectrometry, Spectroscopy, Electron beams, Chemical analysis and testing
ICS19.100
71.040.99
Title in FrenchAnalyse par microfaisceaux. Paramètres de performance instrumentale sélectionnés pour la spécification et le contrôle des spectromètres X à sélection d’énergie utilisés en microanalyse par sonde à électrons
CommitteeCII/9
ISBN978 0 580 66881 4
PublisherBSI
FormatA4
DeliveryYes
Pages22
File Size1.057 MB
Price£134.00


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