BS ISO 13067:2011 - Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

BS ISO 13067:2011

Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Status : Superseded, Withdrawn   Published : November 2011 Replaced By : BS ISO 13067:2020

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Standard NumberBS ISO 13067:2011
TitleMicrobeam analysis. Electron backscatter diffraction. Measurement of average grain size
StatusSuperseded, Withdrawn
Publication Date30 November 2011
Withdrawn Date17 July 2020
Normative References(Required to achieve compliance to this standard)ISO 23833, ISO 24173:2009, ISO 16700, ISO 21748, ISO/IEC 17025
Informative References(Provided for Information)ASTM E930, ASTM E1181, EN 623-3, ASTM E112, ASTM E1382
Replaced ByBS ISO 13067:2020
International RelationshipsISO 13067:2011
Draft Superseded By10/30195133 DC
DescriptorsMicroanalysis, Measurement, Electron beams, Crystal microstructure, Chemical analysis and testing, Electron optics, Spectroscopy, Electron diffraction, Grain size, Particle size distribution
ICS71.040.50
Title in FrenchAnalyse par microfaisceaux. Diffraction d’électrons rétrodiffusés. Mesurage de la taille moyenne des grains
CommitteeCII/9
ISBN978 0 580 65773 3
PublisherBSI
FormatA4
DeliveryYes
Pages32
File Size8.025 MB
Price£182.00


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