BS EN 15991:2011 - Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

BS EN 15991:2011

Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Status : Revised, Withdrawn   Published : February 2011 Replaced By : BS EN 15991:2015

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Standard NumberBS EN 15991:2011
TitleTesting of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
StatusRevised, Withdrawn
Publication Date28 February 2011
Withdrawn Date30 November 2015
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)Regulation (EC) No. 2037/2000, ISO 5022:1979, ISO 8656-1:1988, EN ISO 21068-1:2008, ISO 21068-1:2008, ISO 5725-2:1994, ISO/IEC Guide 98-3, GUM:1995, ISO 5725-4:1994
Replaced ByBS EN 15991:2015
International RelationshipsEN 15991:2011
Draft Superseded By09/30187541 DC
DescriptorsCeramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization
ICS81.060.10
Title in FrenchEssais sur matériaux céramiques et basiques. Détermination directe des fractions massiques d'impuretés dans les poudres et les granulés de carbure de silicium par spectroscopie d'émission optique à plasma induit par haute fréquence (ICP OES) avec vaporisation électrothermique (ETV)
Title in GermanPrüfung keramischer Roh- und Werkstoffe. Direkte Bestimmung der Massenanteile von Spurenverunreinigungen in pulver- und kornförmigem Siliciumcarbid mittels optischer Emissionsspektrometrie mit induktiv gekoppeltem Plasma (ICP OES) und elektrothermischer Verdampfung (ETV)
CommitteeRPI/1
ISBN978 0 580 64180 0
PublisherBSI
FormatA4
DeliveryNo
Pages32
File Size1.271 MB
Price£182.00


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