BS ISO 11938:2012 - Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
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BS ISO 11938:2012

Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

Status : Current, Confirmed   Published : April 2013

Format
PDF

Format
HARDCOPY






Standard NumberBS ISO 11938:2012
TitleMicrobeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
StatusCurrent, Confirmed
Publication Date30 April 2013
Confirm Date20 September 2017
Normative References(Required to achieve compliance to this standard)ISO 22489, ISO 5725-6, ISO 16592:2006, ISO/IEC 17025:2005, ISO 17470, ISO 14594, ISO 23833
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsISO 11938:2012
Draft Superseded By10/30185165 DC
DescriptorsSpectroscopy, X-ray fluorescence spectrometry, Semiconductor diodes, Chemical analysis and testing, Semiconductors, Detectors, Electron beams
ICS71.040.50
Title in FrenchAnalyse par microfaisceaux. Analyse par microsonde électronique (microsonde de Castaing). Méthodes d’analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d’onde
CommitteeCII/9
ISBN978 0 580 63714 8
PublisherBSI
FormatA4
DeliveryYes
Pages22
File Size1.767 MB
Price£130.00


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