DD IEC/PAS 60679-6:2008 - Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
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DD IEC/PAS 60679-6:2008

Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide

Status : Superseded, Withdrawn   Published : May 2008 Replaced By : BS EN 60679-6:2011

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IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.




Standard NumberDD IEC/PAS 60679-6:2008
TitleQuartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
StatusSuperseded, Withdrawn
Publication Date30 May 2008
Withdrawn Date30 June 2011
Normative References(Required to achieve compliance to this standard)IEC 60679-1
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60679-6:2011
International RelationshipsIEC/PAS 60679-6:2008
DescriptorsOscillators, Quartz, Crystals (electronic), Crystal resonators, Piezoelectric devices, Electronic equipment and components, Assessed quality, Phase measurement (electric), Electrical wave measurement, Noise (spurious signals)
ICS31.140
Title in GermanQuarzoszillatoren mit bewerteter Qualität. Phasenjitter-Meßmethoden für Quarzoszillatoren und SAW Oszillatoren. Anwendungsleitfaden
CommitteeEPL/49
ISBN978 0 580 62340 0
PublisherBSI
FormatA4
DeliveryNo
Pages22
File Size1.329 MB
Price£130.00


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