BS IEC 62528:2007 - Standard testability method for embedded core-based integrated circuits

BS IEC 62528:2007

Standard testability method for embedded core-based integrated circuits

Status : Confirmed, Current   Published : December 2007

Format
PDF

Format
HARDCOPY



Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.




Standard NumberBS IEC 62528:2007
TitleStandard testability method for embedded core-based integrated circuits
StatusConfirmed, Current
Publication Date31 December 2007
Confirm Date01 November 2010
Normative References(Required to achieve compliance to this standard)IEEE Std 1500, IEEE P1450.6, IEEE Std 1149.1
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62528:2007
DescriptorsTesting, Electronic engineering, Computer circuits, Microprocessor chips, Electronic equipment and components, Computer hardware, Integrated circuits
ICS31.200
CommitteeEPL/501
ISBN978 0 580 59318 5
PublisherBSI
FormatA4
DeliveryYes
Pages126
File Size2.346 MB
Price£314.00


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