BS IEC 62527:2007 - Standard for extensions to standard test interface language (STIL) for DC level specification

BS IEC 62527:2007

Standard for extensions to standard test interface language (STIL) for DC level specification

Status : Current   Published : December 2007

Format
PDF

Format
HARDCOPY



STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.




Standard NumberBS IEC 62527:2007
TitleStandard for extensions to standard test interface language (STIL) for DC level specification
StatusCurrent
Publication Date31 December 2007
Normative References(Required to achieve compliance to this standard)IEEE Std 1450:1999
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62527:2007
DescriptorsData transfer, Simulation, Interfaces (data processing), Computer applications, Programming languages, Test equipment, Information exchange, Automatic, Data processing, Direct current
ICS25.040.01
35.060
CommitteeEPL/501
ISBN978 0 580 59315 4
PublisherBSI
FormatA4
DeliveryYes
Pages40
File Size1.288 MB
Price£214.00


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