BS IEC 62526:2007 - Standard for extensions to standard test interface language (STIL) for semiconductor design environments

BS IEC 62526:2007

Standard for extensions to standard test interface language (STIL) for semiconductor design environments

Status : Confirmed, Current   Published : December 2007

Format
PDF

Format
HARDCOPY



Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.




Standard NumberBS IEC 62526:2007
TitleStandard for extensions to standard test interface language (STIL) for semiconductor design environments
StatusConfirmed, Current
Publication Date31 December 2007
Confirm Date01 November 2010
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)IEEE P1450.3, IEEE Std 1450-1999, IEEE Std 1364-2001, IEEE Std 100, IEEE Std 1500-2005, IEEE Std 1450.6-2005
International RelationshipsIEC 62526:2007
DescriptorsInformation exchange, Automatic, Data transfer, Test equipment, Data representation, Interfaces (data processing), Computer applications, Simulation, Data processing, Programming languages, Semiconductor devices
ICS25.040.01
35.060
CommitteeEPL/501
ISBN978 0 580 59314 7
PublisherBSI
FormatA4
DeliveryYes
Pages124
File Size2.074 MB
Price£314.00


 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


BSOL

The faster, easier way to work with standards


Worldwide Standards
We can source any standard from anywhere in the world


Develop a PAS

Develop a fast-track standardization document in 9-12 months