BS IEC 62525:2007 - Standard test interface language (STIL) for digital test vector data

BS IEC 62525:2007

Standard test interface language (STIL) for digital test vector data

Status : Current   Published : December 2007

Format
PDF

Format
HARDCOPY



Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.




Standard NumberBS IEC 62525:2007
TitleStandard test interface language (STIL) for digital test vector data
StatusCurrent
Publication Date31 December 2007
Normative References(Required to achieve compliance to this standard)IEEE Std 260.1-1993, ISO 2955:1983, IEEE Std 100-1996, ISO/IEC 9899:1999
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62525:2007
DescriptorsAutomatic, Vectors (mathematics), Information exchange, Programming languages, Interfaces (data processing), Data processing, Computer applications, Data representation, Data transfer, Simulation, Test equipment
ICS19.080
25.040.01
35.060
CommitteeEPL/501
ISBN978 0 580 59313 0
PublisherBSI
FormatA4
DeliveryYes
Pages144
File Size1.478 MB
Price£328.00


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