BS ISO 25498:2010 - Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

BS ISO 25498:2010

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

Status : Superseded, Withdrawn   Published : June 2010 Replaced By : BS ISO 25498:2018

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Standard NumberBS ISO 25498:2010
TitleMicrobeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
StatusSuperseded, Withdrawn
Publication Date30 June 2010
Withdrawn Date23 March 2018
Normative References(Required to achieve compliance to this standard)ISO/IEC 17025
Informative References(Provided for Information)ASTM E 3-2001
Replaced ByBS ISO 25498:2018
International RelationshipsISO 25498:2010 Ed 1
DescriptorsMicroanalysis, Test specimens, Electron microscopes, Spectroscopy, Optical instruments, Electron beams, Electron diffraction, Crystal lattices, Chemical analysis and testing
ICS71.040.50
Title in FrenchAnalyse par microfaisceaux. Microscopie électronique analytique. Analyse par diffraction par sélection d'aire au moyen d'un microscope électronique en transmission
CommitteeCII/9
ISBN978 0 580 57853 3
PublisherBSI
FormatA4
DeliveryYes
Pages40
File Size3.597 MB
Price£214.00


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