DD IEC/PAS 62483:2006 - Test method for measuring whisker growth on tin and tin alloy surface finishes

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DD IEC/PAS 62483:2006

Test method for measuring whisker growth on tin and tin alloy surface finishes

Status : Superseded, Withdrawn   Published : February 2007 Replaced By : BS IEC 62483:2013

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Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document




Standard NumberDD IEC/PAS 62483:2006
TitleTest method for measuring whisker growth on tin and tin alloy surface finishes
StatusSuperseded, Withdrawn
Publication Date28 February 2007
Withdrawn Date31 October 2013
Cross ReferencesJESD22-A104, IPC 7530
Replaced ByBS IEC 62483:2013
International RelationshipsIEC/PAS 62483:2006
DescriptorsElectrical components, Electronic equipment and components, Tin, Tin alloys, Electroplating, Metal coatings, Finishes, Surfaces, Solders, Surface defects, Corrosion, Environmental testing, Testing conditions
ICS31.080.01
Title in GermanPrüfverfahren zur Messung von Whisker-Wachstum bei Oberflächenbeschichtungen aus Zinn oder Zinnlegierung
CommitteeEPL/47
ISBN978 0 580 50147 0
PublisherBSI
FormatA4
DeliveryNo
Pages30
File Size2.777 MB
Price£176.00


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