BS EN 62132-2:2011 - Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. TEM cell and wideband TEM cell method

BS EN 62132-2:2011

Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. TEM cell and wideband TEM cell method

Status : Current   Published : April 2011

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IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.




Standard NumberBS EN 62132-2:2011
TitleIntegrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. TEM cell and wideband TEM cell method
StatusCurrent
Publication Date30 April 2011
Normative References(Required to achieve compliance to this standard)IEC 60050-161:1990, EN 62132-1:2006/Corrigendum:2006, EN 61967-2, IEC 61967-2, IEC 62132-1:2006, IEC 60050-131:2002, EN 62132-1:2006
Informative References(Provided for Information)EN 61000-4-3:2006/A1:2008, CISPR 16-2-3:2006, IEC 61000-4-20:2003, IEC 61000-4-3:2006, EN 61000-4-6:2009, CISPR 16-2-4:2003, EN 61000-4-20:2003, CISPR 16-1-1:2007, EN 55016-2-4:2004, IEC 61000-4-6:2008, CISPR 16-2-1:2008, EN 55016-2-1:2009, CISPR 16-1-2:2006, EN 55016-2-3:2006, IEC 61000-4-3:2006/AMD 1:2007, EN 55016-1-5:2004, CISPR 16-2-2:2005, EN 61000-4-3:2006, EN 55016-1-1:2007, CISPR 16-1-5:2003
International RelationshipsEN 62132-2:2011,IEC 62132-2:2010
Draft Superseded By06/30151320 DC
DescriptorsIntegrated circuits, Radiofrequencies, Electrical wave measurement, Electrical measurement, Electromagnetic compatibility, Electromagnetic radiation, Waveguides, Electronic equipment and components
ICS31.200
Title in FrenchCircuits intégrés. Mesure de l'immunité électromagnétique. Mesure de l'immunité rayonnée. Méthode de cellule TEM et cellule TEM à large bande
Title in GermanIntegrierte Schaltungen. Messung der elektromagnetischen Störfestigkeit. Messung der Störfestigkeit bei Einstrahlungen. TEM-Zellen- und Breitband-TEM-Zellenverfahren
CommitteeEPL/47
ISBN978 0 580 57114 5
PublisherBSI
FormatA4
DeliveryYes
Pages28
File Size1.185 MB
Price£182.00


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