BS ISO 23830:2008 - Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

BS ISO 23830:2008

Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Status : Confirmed, Current   Published : December 2008

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Standard NumberBS ISO 23830:2008
TitleSurface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
StatusConfirmed, Current
Publication Date31 December 2008
Confirm Date12 July 2017
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 7873, ISO 7870-1, ISO 24236
International RelationshipsISO 23830:2008
Draft Superseded By07/30138812 DC
DescriptorsSurface chemistry, Ions, Reproducibility, Chemical analysis and testing, Secondary, Mass spectrometers, Mass spectrometry, Measurement characteristics
ICS71.040.40
Title in FrenchAnalyse chimique des surfaces. Spectrométrie de masse des ions secondaires. Répétabilité et constance de l'échelle des intensités relatives en spectrométrie statique de masse des ions secondaires
Title in GermanChemische Analytik an Oberflächen. Sekundärionenmassenspektrometrie. Wiederholpräzision und Konstanz der relativen Intensitätsskala bei der statischen Sekundärionenmassenspektrometrie
CommitteeCII/60
ISBN978 0 580 55766 8
PublisherBSI
FormatA4
DeliveryYes
Pages24
File Size588 KB
Price£182.00


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