BS IEC 60747-14-4:2011 - Semiconductor devices. Discrete devices. Semiconductor accelerometers

BS IEC 60747-14-4:2011

Semiconductor devices. Discrete devices. Semiconductor accelerometers

Status : Current, Under review   Published : February 2011



IEC 60747-14-4:2011 applies to semiconductor accelerometers for all types of products. This standard applies not only to typical semiconductor accelerometers with built-in electric circuits, but also to semiconductor accelerometers accompanied by external circuits. This standard does not (or should not) violate (or interfere with) the agreement between customers and suppliers in terms of a new model or parameters for business.

NOTE 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass produced type of accelerometer.

NOTE 2: The purpose of this standard is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved. The descriptions are based on latest research results. One typical example is the multi-axis accelerometer. This standard states the method of measuring acceleration as a vector quantity using multi-axis accelerometers.

NOTE 3: This standard does not conflict in any way with any existing parts of either ISO 16063 or ISO 5347. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC.

This publication is to be read in conjunction with

IEC 60747-1:2006


Standard NumberBS IEC 60747-14-4:2011
TitleSemiconductor devices. Discrete devices. Semiconductor accelerometers
StatusCurrent, Under review
Publication Date28 February 2011
Normative References(Required to achieve compliance to this standard)IEC 60749-12, IEC 60749, ISO 5347, IEC 61000-4-4:2004, IEC 61000-4-3:2006, ISO/IEC Guide 99, IEC 60749-13, IEC 60749-1, IEC 60749-11, IEC 60747-1:2006, IEC 60749-10, IEC 61000-4, IEC 60749-25, IEC 60749-5:2017, IEC 60749-6:2017, IEC 61000-4-2:1995, ISO 5347-11:1993
Informative References(Provided for Information)ISO 5349, ISO 13091, ISO 8041, ISO 13090, ISO 16063, GUM:1995, ISO/IEC 17025, ISO 2041, ISO 2631
International RelationshipsIEC 60747-14-4:2011
Draft Superseded By05/30137514 DC
DescriptorsAcceleration measurement, Performance, Electronic equipment and components, Accelerometers, Semiconductor devices, Integrated circuits, Sensitivity, Measurement characteristics
Title in FrenchDispositifs à semiconducteurs. Dispositifs discrets. Accéléromètres à semiconducteurs
ISBN978 0 580 55665 4
File Size2.016 MB

 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents

Worldwide Standards
We can source any standard from anywhere in the world

Develop a PAS

Develop a fast-track standardization document in 9-12 months


Access, view and download standards with multiple user access, across multiple sites with BSOL