BS ISO 24173:2009 - Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

BS ISO 24173:2009

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

Status : Confirmed, Current   Published : October 2009

Format
PDF

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HARDCOPY






Standard NumberBS ISO 24173:2009
TitleMicrobeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
StatusConfirmed, Current
Publication Date31 October 2009
Confirm Date30 October 2015
Normative References(Required to achieve compliance to this standard)ISO/IEC Guide 98-3, GUM:1995, ISO/IEC 17025
Informative References(Provided for Information)ASTM E 3, ASTM E 1558
International RelationshipsISO 24173:2009
Draft Superseded By08/30133935 DC
DescriptorsElectron beams, Microanalysis, Test specimens, Orientation, Measurement, Diffraction, Chemical analysis and testing, Crystallography, Crystal structure, Electron microscopes
ICS71.040.50
Title in FrenchAnalyse par microfaisceaux. Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
Title in GermanMikrobereichsanalyse. Leitfaden zur Messung der Orientierung mit dem Elektronenrückstreudiffraktometrie
CommitteeCII/9
ISBN978 0 580 55397 4
PublisherBSI
FormatA4
DeliveryYes
Pages54
File Size10.09 MB
Price£254.00


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