BS EN 60068-2-82:2007 - Environmental testing. Tests. Test Tx. Whisker test methods for electronic and electric components – BSI British Standards

BS EN 60068-2-82:2007

Environmental testing. Tests. Test Tx. Whisker test methods for electronic and electric components

Status : Superseded, Withdrawn   Published : July 2007 Replaced By : BS EN IEC 60068-2-82:2019

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BS EN 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress.

This test method is employed by a relevant specification (international component or
application specification) with transfer of the test severities to be applied and with defined acceptance criteria.

Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.




Standard NumberBS EN 60068-2-82:2007
TitleEnvironmental testing. Tests. Test Tx. Whisker test methods for electronic and electric components
StatusSuperseded, Withdrawn
Publication Date31 July 2007
Withdrawn Date12 July 2019
Normative References(Required to achieve compliance to this standard)IEC 60068-2-20:1979, IEC 60068-2-58:2004, IEC 60068-2-14, IEC 61760-1:2006, EN 61760-1:2006, IEC 61192-3:2002, EN 60068-2-78:2001, EN 60068-1:1994, EN 61192-3:2003, IEC 60068-2-78, EN 60068-2-58:2004, EN 60068-2-58:2004/Corrigendum:2004, EN 60068-2-14:1999, HD 323.2.20 S3:1988, IEC 60068-1:1988
Informative References(Provided for Information)IEC 60068-3-4, IEC 61193-2, EN 60068-3-4:2001
Replaced ByBS EN IEC 60068-2-82:2019
International RelationshipsEN 60068-2-82:2007,IEC 60068-2-82:2007
Draft Superseded By05/30133273 DC
DescriptorsPrinted-circuit boards, Elongation, Crystal growth, Tin, Surface defects, Electrical equipment, Finishes, Solders, Electronic equipment and components, Environmental testing, Testing conditions, Test equipment, Tin alloys, Electrical components, Dimensional changes
ICS19.040
31.190
Title in FrenchEssais d'environnement. Essais. Essai Tx. Méthodes d'essai des trichites ("moustaches/whiskers") pour les composants électriques et électroniques
Title in GermanUmgebungseinflüsse. Prüfungen. Prüfung Tx. Whisker-Prüfverfahren für elektronische und elektrische Bauelemente
CommitteeEPL/501
ISBN978 0 580 55334 9
PublisherBSI
FormatA4
DeliveryYes
Pages36
File Size1.837 MB
Price£214.00


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