BS EN 60749-26:2006 - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Essential maintenance work will be carried out on BSI Shop over the weekend of 12 and 13 June 2021. BSI Shop will be operational during this time but you might experience slowness for a very brief period of time. Please accept our apologies for any inconvenience this may cause.

BS EN 60749-26:2006

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Status : Revised, Superseded, Withdrawn   Published : September 2006 Replaced By : BS EN 60749-26:2014

WITHDRAWN TITLE
*To ask about withdrawn titles contact the
Customer Relations
cservices@bsigroup.com, +44 345 086 9001


Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.




Standard NumberBS EN 60749-26:2006
TitleSemiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
StatusRevised, Superseded, Withdrawn
Publication Date29 September 2006
Withdrawn Date30 June 2014
Normative References(Required to achieve compliance to this standard)IEC 61340-3-1, EN 61340-3-1:2002, IEC 60749-27, EN 60749-27:2006
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60749-26:2014
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsEN 60749-26:2006,IEC 60749-26:2006,IEC 60893-3-2:2003/AMD1:2011
Draft Superseded By05/30128291 DC
DescriptorsSensitivity, Electrical testing, Environmental testing, Test models, Climate, Integrated circuits, Electrostatics, Classification systems, Electronic equipment and components, Grades (quality), Mechanical testing, Human body, Degradation, Damage, Semiconductor devices
ICS29.035.01
31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Essai de sensibilite aux decharges electrostatiques (DES). Modele du corps humain (HBM)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Pruefung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Human Body Model (HBM)
CommitteeEPL/47
ISBN0 580 49295 8
PublisherBSI
FormatA4
DeliveryNo
Pages18
File Size1.727 MB
Price£134.00


WITHDRAWN TITLE
*To ask about withdrawn titles contact the
Customer Relations
cservices@bsigroup.com, +44 345 086 9001
 Your basket
Your basket is empty

Multi-user access to over 3,500 medical device standards, regulations, expert commentaries and other documents


BSOL

Access, view and download standards with multiple user access, across multiple sites with BSOL


Tracked Changes

Understand the changes made to a standard with our new Tracked Changes version


Worldwide Standards
We can source any standard from anywhere in the world