BS EN 60749-26:2006 - Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS EN 60749-26:2006

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Status : Revised, Superseded, Withdrawn   Published : September 2006 Replaced By : BS EN 60749-26:2014

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Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.




Standard NumberBS EN 60749-26:2006
TitleSemiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
StatusRevised, Superseded, Withdrawn
Publication Date29 September 2006
Withdrawn Date30 June 2014
Normative References(Required to achieve compliance to this standard)IEC 61340-3-1, EN 61340-3-1:2002, IEC 60749-27, EN 60749-27:2006
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS EN 60749-26:2014
ReplacesBS EN 60749:1999, IEC 60749:1996
International RelationshipsIEC 60893-3-2:2003/AMD1:2011,IEC 60749-26:2006,EN 60749-26:2006
Draft Superseded By05/30128291 DC
DescriptorsSensitivity, Electrical testing, Environmental testing, Test models, Climate, Integrated circuits, Electrostatics, Classification systems, Electronic equipment and components, Grades (quality), Mechanical testing, Human body, Degradation, Damage, Semiconductor devices
ICS29.035.01
31.080.01
Title in FrenchDispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Essai de sensibilite aux decharges electrostatiques (DES). Modele du corps humain (HBM)
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Pruefung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Human Body Model (HBM)
CommitteeEPL/47
ISBN0 580 49295 8
PublisherBSI
FormatA4
DeliveryNo
Pages18
File Size859 KB
Price£130.00


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