BS ISO 22493:2008 - Microbeam analysis. Scanning electron microscopy. Vocabulary

BS ISO 22493:2008

Microbeam analysis. Scanning electron microscopy. Vocabulary

Status : Revised, Superseded, Withdrawn   Published : October 2008 Replaced By : BS ISO 22493:2014

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Standard NumberBS ISO 22493:2008
TitleMicrobeam analysis. Scanning electron microscopy. Vocabulary
StatusRevised, Superseded, Withdrawn
Publication Date31 October 2008
Withdrawn Date30 April 2014
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)ISO 704, ISO 1087-1, ISO 10241, ISO 18115:2001, ISO 23833
Replaced ByBS ISO 22493:2014
International RelationshipsISO 22493:2008
Draft Superseded By06/30128226 DC
DescriptorsScanning electron microscopes, Electron microscopes, Microscopes, Electron beams, Electron optics, Optical instruments, Vocabulary, Terminology, Instrumental methods of analysis
ICS01.040.37
01.040.71
37.020
71.040.50
Title in FrenchAnalyse par microfaisceaux. Microscopie électronique à balayage. Vocabulaire
Title in GermanMikrobereichsanalyse. Rasterelektronenmikroskopie. Vokabular
CommitteeCII/9
ISBN978 0 580 54987 8
PublisherBSI
FormatA4
DeliveryNo
Pages34
File Size385.3 KB
Price£214.00


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