BS EN 60749-38:2008 - Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory

BS EN 60749-38:2008

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory

Status : Current   Published : June 2008

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HARDCOPY



This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation. Two tests are described; an accelerated test using an alpha radiation source and an (unaccelerated) real-time system test where any errors are generated under conditions of naturally occurring radiation which can be alpha or other radiation such as neutron. To completely characterize the soft error capability of an integrated circuit with memory, the device must be tested for broad high energy spectrum and thermal neutrons using additional test methods. This test method may be applied to any type of integrated circuit with memory device.




Standard NumberBS EN 60749-38:2008
TitleSemiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory
StatusCurrent
Publication Date30 June 2008
Normative References(Required to achieve compliance to this standard)No other standards are normatively referenced
Informative References(Provided for Information)JESD89, JESD89-1, JEITA EDR4705, JESD89-2, JESD89-3
International RelationshipsEN 60749-38:2008,IEC 60749-38:2008
Draft Superseded By04/30126443 DC
DescriptorsErrors, Environmental testing, Electronic equipment and components, Computer storage devices, Semiconductor devices, Mechanical testing, Integrated circuits, Alpha particles
ICS31.080.01
Title in FrenchDispositifs a semiconducteurs. Méthodes d'essais mécaniques et climatiques. Méthode d'essai des erreurs logicielles pour les dispositifs à semiconducteurs avec mémoire
Title in GermanHalbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher
CommitteeEPL/47
ISBN978 0 580 54875 8
PublisherBSI
FormatA4
DeliveryYes
Pages16
File Size637 KB
Price£130.00


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