BS ISO 16700:2004 - Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS ISO 16700:2004

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Status : Revised, Withdrawn   Published : September 2004 Replaced By : BS ISO 16700:2016

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Standard NumberBS ISO 16700:2004
TitleMicrobeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
StatusRevised, Withdrawn
Publication Date29 September 2004
Confirm Date01 October 2007
Withdrawn Date31 July 2016
Normative References(Required to achieve compliance to this standard)ISO Guide 30:1992, ISO Guide 34:1996, ISO Guide 35:1989, ISO 5725-1:1994, ISO/IEC 17025:1999
Informative References(Provided for Information)No other standards are informatively referenced
Replaced ByBS ISO 16700:2016
International RelationshipsISO 16700:2004
Draft Superseded By00/124017 DC
DescriptorsScanning electron microscopes, Electron microscopes, Microscopes, Optical instruments, Electron optics, Electron beams, Magnification, Optical phenomena, Calibration, Control samples, Accuracy
ICS37.020
Title in FrenchAnalyse par microfaisceaux. Microscopie electronique a balayage. Lignes directrices pour l'etalonnage du grossissement d'image
Title in GermanMikrosondenanalyse. Rasterelektronenmikroskopie. Anleitung fuer die Kalibrierung der Bildvergroesserung
CommitteeCII/9
ISBN0 580 44519 4
PublisherBSI
FormatA4
DeliveryNo
Pages26
File Size771.3 KB
Price£182.00


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