BS ISO 22489:2006 - Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

BS ISO 22489:2006

Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

Status : Revised, Withdrawn   Published : February 2007 Replaced By : BS ISO 22489:2016

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Standard NumberBS ISO 22489:2006
TitleMicrobeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
StatusRevised, Withdrawn
Publication Date28 February 2007
Confirm Date01 August 2010
Withdrawn Date31 October 2016
Normative References(Required to achieve compliance to this standard)ISO 14594, ISO/IEC 17025:2005, ISO 22309:2006, ISO 17470, ISO 14595
Informative References(Provided for Information)ISO 23833
Replaced ByBS ISO 22489:2016
International RelationshipsISO 22489:2006
Draft Superseded By05/30118737 DC
DescriptorsX-rays, Spectroscopy, Instrumental methods of analysis, Chemical analysis and testing, Specimen preparation, Microanalysis, Test equipment, X-ray analysis, Dispersion (waves), Electron beams, Wavelengths
ICS71.040.99
Title in FrenchAnalyse par microfaisceaux. Analyse par microsonde de Castaing. Analyse quantitative ponctuelle d'échantillons massifs par spectrométrie X à dispersion de longueur d'onde
Title in GermanMikrobereichsanalyse. Elektronenstrahl-Mikroanalyse. Quantitative Punktanalyse von Volumenmaterial mittels wellenlängendispersiver Röntgenspektroskopie
CommitteeCII/9
ISBN978 0 580 50237 8
PublisherBSI
FormatA4
DeliveryNo
Pages24
File Size482 KB
Price£182.00


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